Phase composition of Cr-C thin films deposited by a double magnetron sputtering system

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作者
Groudeva-Zotova, S. [1 ]
Vitchev, R.G. [2 ,3 ]
Blanpain, B. [2 ]
机构
[1] Institute of Electronics, BAS, 72 Tzarigradsko Chaussee Blvd., 1784 Sofia, Bulgaria
[2] Dept. of Metall. and Mat. Eng., Katholieke Universiteit Leuven, W. De Croylaan 2, B-3001 Leuven, Belgium
[3] Dept. of Metall. and Mat. Eng. (MTM), Katholieke Universiteit Leuven, W. De Croylaan 2, B-3001 Leuven, Belgium
关键词
Amorphous films - Carbides - Crystalline materials - Electric resistance - Magnetron sputtering - Phase composition - Scanning electron microscopy - Solid solutions - Sputter deposition - Stoichiometry - Thin films - X ray diffraction analysis;
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摘要
Non-reactive d.c. magnetron sputtering by two magnetron sources with inclined geometry was used for deposition of Cr-C thin films with C:Cr ratio in the range 0.08-2.40. The phase composition of the films was investigated by x-ray diffraction, XPS, SEM and resistivity measurements. Four phase compositional regions were distinguished in the investigated large compositional range: films containing mainly microcrystalline Cr or Cr-C solid solution; films containing both the microcrystalline Cr phase and the stoichiometric Cr23C6 carbide phase (β-phase); amorphous-like films composed of the ultradisperse Cr crystalline phase and different metastable carbides; and amorphous films consisting of a carbon matrix with a limited amount of a high-carbon carbide phase dispersed in it. The films from the first two regions exhibit very high microhardness and good wear resistivity, and at the same time a relatively low electrical resistivity, which make them promising coating materials for electronic applications.
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