PROBLEMS IN INTERPRETING SILICON EBIC MEASUREMENTS.

被引：0
|
作者：
Kittler, M.
Seifert, W.
Richter, H.
机构：
来源：
| 1600年 / 51期
关键词：
Experimental; (EXP);
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATIONS IN SILICON USING A COMPUTERIZED EBIC SYSTEM
    WILSHAW, PR
    OURMAZD, A
    BOOKER, GR
    JOURNAL DE PHYSIQUE, 1983, 44 (NC-4): : 445 - 450
  • [32] COMPARISON OF EBIC AND DLTS MEASUREMENTS ON BORON-DOPED CZ SILICON CONTAMINATED WITH IRON
    KITTLER, M
    SEIFERT, W
    SCHMALZ, K
    TITTELBACHHELMRICH, K
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 96 (02): : K133 - &
  • [33] INTERPRETING CAPILLARY PRESSURE AND ROCK WETTING CHARACTERISTICS FROM UNSTEADY-STATE DISPLACEMENT MEASUREMENTS.
    Batycky, J.P.
    McCaffery, Frank G.
    Hodgins, Peter K.
    Fisher, Douglas B.
    Society of Petroleum Engineers of AIME, (Paper) SPE, 1980,
  • [34] INTENSITY DEPENDENCE OF DIFFUSION LENGTH IN AMORPHOUS SILICON BY SURFACE PHOTOVOLTAGE MEASUREMENTS.
    Moore, A.R.
    Kane, D.E.
    1600, (56):
  • [35] The effect of residual adsorbed gases on silicon isotope amount ratio measurements.
    Valkiers, S
    Gonfiantini, R
    Taylor, P
    De Bievre, P
    1998 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 1998, : 392 - 392
  • [36] PINPOINT DISK-DRIVE DESIGN PROBLEMS USING AUTOMATED MEASUREMENTS.
    Phillips, Gary
    EDN, 1984, 29 (07) : 175 - 182
  • [37] General problems of metrology and measurement technique -: Uncertainty of measurements.: Part 1
    Golubev, ÉA
    MEASUREMENT TECHNIQUES, 2003, 46 (10) : 924 - 930
  • [38] INTERPRETATION OF THE EBIC CONTRAST OF DISLOCATIONS IN SILICON
    PASEMANN, L
    BLUMTRITT, H
    GLEICHMANN, R
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 70 (01): : 197 - 209
  • [39] EBIC DIFFUSION LENGTH OF DISLOCATED SILICON
    CASTALDINI, A
    CAVALLINI, A
    CAVALCOLI, D
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1987, (87): : 709 - 714
  • [40] Reliable comet measurements.
    Kumaravel, TS
    ENVIRONMENTAL AND MOLECULAR MUTAGENESIS, 2004, 44 (03) : 211 - 211
12345