INVESTIGATON OF THE STRENGTH OF THIN TUNGSTEN FILMS.

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Garber, R.I.
Geysherik, V.S.
Mikhaylovskiy, I.M.
Fedorova, L.I.
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| 1600年 / 42期
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The strength of thin monocrystalline tungsten foils is examined in programmes of stationary ( sigma equals 1500 kg/mm**2), single-pulse ( SIGMA greater than 1500 kg/mm**2) and pulsating ( sigma equals 0 minus 1. 2 multiplied by 10**3 kg/mm**2) loading with electric field in the chamber of a field-ion microscope. The dislocation structure of the thin foils was observed before and after rupture by transmission electron microscopy.
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