The in-situ TEM observation of chemisorption facilitating dislocation emission, multiplication and motion

被引：0
|
作者：
机构：
来源：
Chin Sci Bull | / 10卷 / 875期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] IN-SITU TEM OBSERVATION OF NANOSILICON FIBRE GROWTH
    F.C.Zhang 1)
    ActaMetallurgicaSinica(EnglishLetters), 1999, (05) : 1069 - 1072
  • [22] In-situ TEM Observation of Brittle Microcrack Nucleation
    张跃
    王燕斌
    褚武扬
    肖纪美
    Chinese Science Bulletin, 1994, (12) : 980 - 982
  • [23] IN-SITU TEM OBSERVATION OF BRITTLE MICROCRACK NUCLEATION
    ZHANG, Y
    WANG, YB
    CHU, WY
    XIAO, JM
    CHINESE SCIENCE BULLETIN, 1994, 39 (12): : 980 - 982
  • [24] The in-situ TEM observation of nanocrack in titanium aluminide
    褚武杨
    张跃
    王燕斌
    肖纪美
    Science China Mathematics, 1995, (02) : 233 - 242
  • [25] THE IN-SITU TEM OBSERVATION OF NANOCRACK IN TITANIUM ALUMINIDE
    CHU, WY
    ZHANG, Y
    WANG, YB
    XIAO, JM
    SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY & TECHNOLOGICAL SCIENCES, 1995, 38 (02): : 233 - 242
  • [26] IN-SITU TEM STUDY OF DISLOCATION MOBILITY IN SEMICONDUCTING MATERIALS
    LOUCHET, F
    PELISSIER, J
    CAILLARD, D
    PEYRADE, JP
    LEVADE, C
    VANDERSCHAEVE, G
    MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1993, 4 (2-3): : 199 - 210
  • [27] Dislocation motion induced by pulse current in Ti/Al bimetal composite observed by in-situ TEM
    Huang, Tao
    Xing, Bing-hui
    Song, Kexing
    Xiang, Nan
    Xu, Liujie
    Huang, Liang
    Guo, Junqing
    Yang, Xiubo
    MATERIALS CHARACTERIZATION, 2024, 214
  • [28] In-situ TEM observation of the evolution of helium bubbles & dislocation loops and their interaction in Pd during He~+ irradiation
    Qing Han
    Yipeng Li
    Guang Ran
    Xinyi Liu
    Lu Wu
    Yang Chen
    Piheng Chen
    Xiaoqiu Ye
    Yifan Ding
    Xiaoyong Wu
    Journal of Materials Science & Technology, 2021, 87 (28) : 108 - 119
  • [29] OBSERVATION OF JERKY MOTION OF DISLOCATION IN AL FOIL BY STROBOSCOPIC TEM
    TAKAOKA, A
    MORI, H
    URA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (03): : 298 - 298
  • [30] In-situ TEM observation of Cu/MoOx ReRAM switching
    Kudo, M.
    Ohno, Y.
    Hamada, K.
    Arita, M.
    Takahashi, Y.
    NONVOLATILE MEMORIES 2, 2013, 58 (05): : 19 - 25
12345