ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY IN MIS STRUCTURES.

被引：0
|
作者：
Yamaguchi, Eiichi
机构：
来源：
| 1628年 / 21期
关键词：
SPECTROSCOPY;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Metastability of interstitial clusters in ion-damaged silicon studied by isothermal capacitance transient spectroscopy
    Giri, PK
    DEFECTS AND DIFFUSION IN SEMICONDUCTORS, 2002, 210-2 : 1 - 13
  • [32] Electrochemical isothermal-capacitance-transient spectroscopy: A new depth profiling method of deep levels
    Wang, S. Q.
    Lu, F.
    Oh, D. C.
    Chang, J. H.
    Hanada, T.
    Yao, T.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (09):
  • [33] ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY - ITS APPLICATION TO THE STUDY OF GAP STATES OF A-SI-H
    OKUSHI, H
    TOKUMARU, Y
    YAMASAKI, S
    OHEDA, H
    TANAKA, K
    JOURNAL DE PHYSIQUE, 1981, 42 (NC4): : 613 - 616
  • [34] Characterization of lattice-mismatched InGaAs/AlGaAs heterointerface by modified isothermal capacitance transient spectroscopy
    Izumi, S
    Shimura, T
    Hayafuji, N
    Sonoda, T
    Takamiya, S
    COMPOUND SEMICONDUCTORS 1995, 1996, 145 : 419 - 424
  • [35] ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY MEASUREMENTS ON POLYCRYSTALLINE DIAMOND HYDROGENATED AMORPHOUS-SILICON HETEROJUNCTIONS
    KIYOTA, H
    OKUSHI, H
    OKANO, K
    AKIBA, Y
    KUROSU, T
    IIDA, M
    APPLIED PHYSICS LETTERS, 1992, 61 (15) : 1808 - 1810
  • [36] NEW APPLICATION FOR ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY - IDENTIFICATION OF TUNNELING IN SEMICONDUCTOR-INSULATOR INTERFACES
    PALOURA, EC
    LAGOWSKI, J
    GATOS, HC
    APPLIED PHYSICS LETTERS, 1991, 58 (02) : 137 - 139
  • [37] Observation of mid-gap states in GaN with optical-isothermal capacitance transient spectroscopy
    Hacke, P
    Miyoshi, H
    Hiramatsu, K
    Okumura, H
    Yoshida, S
    Okushi, H
    III-V NITRIDES, 1997, 449 : 549 - 554
  • [38] STUDY OF DEEP HOLE AND ELECTRON TRAPS IN NITROGEN-DOPED ZNSE BY ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY AND DEEP-LEVEL TRANSIENT SPECTROSCOPY
    TANAKA, K
    ZHU, ZQ
    YAO, T
    APPLIED PHYSICS LETTERS, 1995, 66 (24) : 3349 - 3351
  • [39] INFLUENCE OF A SHIELDING ON THE CAPACITANCE OF MICROSTRIP DISK AND RING STRUCTURES.
    Sharma, Arvind K.
    Bhata, Bharathi
    AEU. Archiv fur Elektronik und Ubertragungstechnik, 1980, 34 (01): : 41 - 44
  • [40] SEMIAUTOMATIC SYSTEM FOR MEASURING THE NONEQUILIBRIUM CAPACITANCE OF SEMICONDUCTOR STRUCTURES.
    Kislov, N.A.
    Kokhanchik, G.N.
    Instruments and experimental techniques New York, 1981, 24 (4 pt 2): : 1058 - 1061
12345