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- [1] ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY IN MIS STRUCTURES JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1982, 21 (11): : 1628 - 1632
- [3] A MODIFIED METHOD OF ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (03): : 381 - 382
- [4] ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY IN ZNO VARISTOR JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (04): : L714 - L716
- [5] Use of the Diagram of Complex Capacitance for the Determination of the Inversion Region in MIS Structures. Elektrotechnicky obzor, 1981, 70 (5-6): : 291 - 295
- [8] Differential isothermal capacitance transient spectroscopy for the studies of deep levels in semiconductors REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (05): : 2116 - 2120
- [9] ANALYSIS OF SURFACE-STATES EMPLOYING ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1984, 187 (APR): : 45 - ANYL
- [10] MODEL OF THE AVALANCHE MULTIPLICATION IN MIS STRUCTURES. Physica Status Solidi (A) Applied Research, 1986, 93 (01): : 361 - 367