Rotation grinding of silicon-wafers

被引:0
|
作者
Karpuschewski, B. [1 ]
Lehnicke, S. [1 ]
机构
[1] Univ of Hanover, Germany
来源
Abrasives | 1999年 / APR./MAY期
关键词
Crystal defects - Electrochemistry - Grinding (machining) - Grinding machines - Grinding wheels - Lapping - Rotation - Scanning electron microscopy - Silicon wafers;
D O I
暂无
中图分类号
学科分类号
摘要
The production of silicon wafers starts by zone or crucible pulling of the monocrystalline silicon ingot which is then cut into single wafers of 0.7 mm thickness. As the wafers still have crystal and geometric defects, a following finish-machining is necessary. The traditional method of lapping for finish-machining is replaced by flat grinding, especially by a rotation grinding method, whose kinematics offer several advantages. Rotation grinding assures a constant contact length between wafer and grinding wheel. Therefore, the grinding forces, which have direct influence on crystal defects induced by matching, are constant. In order to quantify the machined wafers, geometrical, physical and chemical aspects have to be regarded.
引用
收藏
相关论文
共 50 条
  • [21] RAPID ISOTHERMAL PROCESSING OF SILICON-WAFERS
    GILL, SS
    PHYSICS IN TECHNOLOGY, 1986, 17 (06): : 245 - &
  • [22] TRANSPORT OF EXCESS CARRIERS IN SILICON-WAFERS
    KUNST, M
    SANDERS, A
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (01) : 51 - 59
  • [23] PREOXIDATION UV TREATMENT OF SILICON-WAFERS
    RUZYLLO, J
    DURANKO, GT
    HOFF, AM
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8A) : 2052 - 2055
  • [24] PHOTOACOUSTIC MEASUREMENTS OF DOPED SILICON-WAFERS
    AMATO, G
    BENEDETTO, G
    SPAGNOLO, R
    TURNATURI, M
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 114 (02): : 519 - 523
  • [25] ULTRATHIN FILMS OF CELLULOSE ON SILICON-WAFERS
    SCHAUB, M
    WENZ, G
    WEGNER, G
    STEIN, A
    KLEMM, D
    ADVANCED MATERIALS, 1993, 5 (12) : 919 - 922
  • [26] PARALLELISM IMPROVEMENT OF GROUND SILICON-WAFERS
    MATSUI, S
    HORIUCHI, T
    JOURNAL OF ENGINEERING FOR INDUSTRY-TRANSACTIONS OF THE ASME, 1991, 113 (01): : 25 - 28
  • [27] INTERFEROMETRIC FLATNESS TESTING OF SILICON-WAFERS
    FEITSCHER, R
    FRITZ, H
    KORNER, K
    FRINGE 89: PROCEEDINGS OF THE 1ST INTERNATIONAL WORKSHOP ON AUTOMATIC PROCESSING OF FRINGE PATTERNS, 1989, 10 : 57 - 61
  • [28] HYDROPHILICITY OF SILICON-WAFERS FOR DIRECT BONDING
    KISSINGER, G
    KISSINGER, W
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1991, 123 (01): : 185 - 192
  • [29] CARRIER LIFETIME MEASUREMENTS IN SILICON-WAFERS
    GHOSH, AK
    TIEDJE, T
    HABERMAN, JI
    FRANCIS, RW
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (03) : C86 - C86
  • [30] TESTING FOR OXYGEN PRECIPITATION IN SILICON-WAFERS
    不详
    SOLID STATE TECHNOLOGY, 1987, 30 (03) : 85 - 89