Ion beam chopping method for low energy time-of-flight measurements

被引：0
|
作者：
Aratari, R. [1 ]
机构：
[1] EURATOM Assoc, Germany
来源：
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1988年 / B34卷 / 04期
关键词：
Electronic Circuits - Ions - Magnetic Field Effects - Spectrum Analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Chopping an ion beam by electrically sweeping it over an aperture produces a degradation of the beam quality. After a short review of the problem, a simple alternative method is presented and experimental results are shown.
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页码：493 / 498
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