ELECTRICAL RESISTIVITY OF Te-Se ALLOY THIN FILMS.

被引：0
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作者：
Garg, J.C.
Jain, S.K.
Jain, B.C.
机构：
来源：
Indian Journal of Pure and Applied Physics | 1981年 / 19卷 / 04期
关键词：
FILMS - Electric Conductivity;
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摘要：
The dc electrical resistivity of vacuum-evaporated thin planar films of Te//xSe//1// minus //x alloys was measured as a function of tellurium atomic fraction x after annealing at 323 K. A plot of resistivity versus x of film reveals a steep decrease of resistivity from 10**7 ohm-cm to 10**2 ohm-cm at 0. 30 less than x less than 0. 40, suggesting a phase transition. Results are interpreted in terms of structural changes observed through electron-microscopic study.
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页码：319 / 322
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