Imaging of dopants in surface and sub-surface layers of the transitionmetal dichalcogenides WS2and WSe2by scanning tunneling microscopy

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作者：
Matthes, Th.W. [2 ]
Sommerhalter, Ch. [2 ]
Rettenberger, A. [1 ]
Bruker, P. [1 ]
Boneberg, J. [1 ]
Lux-Steiner, M.Ch. [2 ]
Leiderer, P. [1 ]
机构：
[1] University of Konstanz, Physics Department, Universitätsstr. 10, D-78434 Konstanz, Germany
[2] Hahn-Meitner-Institut Berlin, Glienicker Str. 100, D-14109 Berlin, Germany
来源：
Applied Physics A: Materials Science and Processing | 1998年 / 66卷 / SUPPL. 1期
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