Surface roughness measurements by means of laser light scattering

被引：0
|
作者：
Takai, Nobukatsu
机构：
来源：
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering | 1998年 / 64卷 / 09期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1304 / 1307
相关论文
共 50 条
  • [21] Surface roughness measurement of tooling spheres for laser measurements
    Sarr, DP
    Reed, PW
    MACHINE VISION AND THREE-DIMENSIONAL IMAGING SYSTEMS FOR INSPECTION AND METROLOGY, 2001, 4189 : 229 - 238
  • [22] A METHOD FOR SURFACE-ROUGHNESS MEASUREMENT BY MEANS OF LIGHT REFLECTANCE
    SAKAI, I
    SAWABE, M
    BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1982, 16 (02): : 123 - 124
  • [23] Influence of roughness on surface scanning by means of a laser stripe system
    Cuesta, Eduardo
    Carlos Rico, J.
    Fernandez, Pedro
    Blanco, David
    Valino, Gonzalo
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2009, 43 (11-12): : 1157 - 1166
  • [24] The modification of the surface roughness spectrum by means of power laser radiation
    Aksenov, VP
    Mikhailova, GN
    Boneberg, J
    Leiderer, P
    Muenzer, HJ
    NONRESONANT LASER-MATTER INTERACTION (NLMI-10), 2001, 4423 : 68 - 69
  • [25] Influence of roughness on surface scanning by means of a laser stripe system
    Eduardo Cuesta
    J. Carlos Rico
    Pedro Fernández
    David Blanco
    Gonzalo Valiño
    The International Journal of Advanced Manufacturing Technology, 2009, 43 : 1157 - 1166
  • [26] Analysis of surface roughness heterogeneity and scattering behavior for radar measurements
    Zribi, Mehrez
    Baghdadi, Nicolas
    Guerin, Christine
    IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 2006, 44 (09): : 2438 - 2444
  • [27] SURFACE-ROUGHNESS STUDIES WITH DALLAS-DETECTOR ARRAY FOR LASER-LIGHT ANGULAR SCATTERING
    VORBURGER, TV
    TEAGUE, EC
    SCIRE, FE
    MCLAY, MJ
    GILSINN, DE
    JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1984, 89 (01): : 3 - 16
  • [28] DENSITY MEASUREMENTS OF LASER PRODUCED PLASMA BY LASER LIGHT SCATTERING
    IZAWA, Y
    YAMANAKA, T
    TSUCHIMORI, N
    ONISHI, M
    YAMANAKA, C
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (08) : 954 - +
  • [29] NONSTATIONARY SURFACE-ROUGHNESS MEASUREMENT BY LIGHT-SCATTERING
    GRABE, M
    PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1972, 60 (03): : 339 - &
  • [30] Characterizing surface roughness of thin films by polarized light scattering
    Germer, TA
    Fasolka, MJ
    ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES, 2003, 5188 : 264 - 275
12345