Spectroscopic ellipsometry moves from lab to fab

被引：0
|
作者：
机构：
来源：
Research & Development (Barrington, Illinois) | 1996年 / 38卷 / 07期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Oxide electronics: Translating materials science from lab-to-fab
    Nathan, Arokia
    Jeon, Sanghun
    MRS BULLETIN, 2021, 46 (11) : 1028 - 1036
  • [42] Semiconductor spin qubits from lab to fab: recent progress and perspectives
    Hutin, Louis
    2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA, 2024,
  • [43] FROM THE BAUHAUS TO THE FAB LAB. THE DIGITAL REVOLUTION OF LEARNING BY DOING
    Santos Arias, Fabricio
    EGA-REVISTA DE EXPRESION GRAFICA ARQUITECTONICA, 2021, 26 (42): : 192 - 203
  • [44] FBI lab moves into new home
    不详
    CHEMICAL & ENGINEERING NEWS, 2003, 81 (18) : 28 - 28
  • [45] NASA lab moves on technology transfer
    ENR, 5 (22):
  • [46] Oxide electronics: Translating materials science from lab-to-fab
    Arokia Nathan
    Sanghun Jeon
    MRS Bulletin, 2021, 46 : 1028 - 1036
  • [47] ATM testing moves out of the lab
    Brightman, Joan
    Telephony, 1995, 229 (16):
  • [48] Spectroscopic Ellipsometry of Surface Plasmons
    Budai, J.
    Papa, Z.
    Csontos, J.
    Dombi, P.
    2019 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC), 2019,
  • [49] Broadband femtosecond spectroscopic ellipsometry
    Richter, Steffen
    Rebarz, Mateusz
    Herrfurth, Oliver
    Espinoza, Shirly
    Schmidt-Grund, Ruediger
    Andreasson, Jakob
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2021, 92 (03):
  • [50] SPECTROSCOPIC ELLIPSOMETRY OF FESI FILMS
    PATRINI, M
    MARABELLI, F
    ONDA, N
    VONKANEL, H
    HELVETICA PHYSICA ACTA, 1993, 66 (04): : 421 - 422
12345