Residual stresses in unidirectional Al2O3 fiber/silicate glass composites by X-ray diffraction

被引:0
|
作者
Hehn, L.
Predecki, P.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] X-ray diffraction determination of residual stresses in functionally graded WC-Co composites
    Larsson, C
    Odén, M
    INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS, 2004, 22 (4-5): : 177 - 184
  • [42] Internal strain measurements and X-ray Imaging in interpenetrating-phase Al2O3/Al composites
    Young, ML
    Almer, JD
    Lienert, U
    Fezzaa, K
    Lee, WK
    Haeffner, DR
    Dunand, DC
    NEUTRON AND X-RAY SCATTERING AS PROBES OF MULTISCALE PHENOMENA, 2005, 840 : 225 - 230
  • [43] X-ray diffraction investigation of GaN layers on Si(111) and Al2O3 (0001) substrates
    Safriuk, N. V.
    Stanchu, G. V.
    Kuchuk, A. V.
    Kladko, V. P.
    Belyaev, A. E.
    Machulin, V. F.
    SEMICONDUCTOR PHYSICS QUANTUM ELECTRONICS & OPTOELECTRONICS, 2013, 16 (03) : 265 - 272
  • [44] Nanostructure and peculiarities of X-ray powder diffraction patterns of low temperature Al2O3 polymorphs
    Tsybulya, Sergey
    Kryukova, Galina
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2006, 62 : S239 - S239
  • [45] Solution of the inverse problem of X-ray diffraction on periodic InGaN/GaN/Al2O3 nanostructures
    Krasil'nikov, AG
    Punegov, VI
    Faleev, NN
    TECHNICAL PHYSICS LETTERS, 2004, 30 (06) : 489 - 493
  • [46] Study of GaN/Al2O3 by high resolution three-crystal X-ray diffraction
    School of Materials Science and Engineering, Nanchang University, Nanchang 330047, China
    不详
    J Fun Mater Dev, 2006, 6 (524-528):
  • [47] Preparation of Pd/γ-Al2O3 nanocatalyst and Characterization by X-Ray Diffraction and Transmission Electron Microscope
    Hassan, Karim H.
    ADVANCED MATERIALS RESEARCH III, 2013, 685 : 312 - 315
  • [48] Solution of the inverse problem of X-ray diffraction on periodic InGaN/GaN/Al2O3 nanostructures
    A. G. Krasil’nikov
    V. I. Punegov
    N. N. Faleev
    Technical Physics Letters, 2004, 30 : 489 - 493
  • [49] X-ray diffraction study of the hydrogen reduction of, NiO/α-Al2O3 steam reforming catalysts
    Richardson, JT
    Scates, RM
    Twigg, MV
    APPLIED CATALYSIS A-GENERAL, 2004, 267 (1-2) : 35 - 46
  • [50] Characterization of SiC/Al2O3 interface by synchrotron radiation X-ray grazing incident diffraction
    Liu, Zhongliang
    Kang, Chaoyang
    Tang, Jun
    Chen, Xiangcun
    Xu, Pengshou
    Pan, Guoqiang
    Zhenkong Kexue yu Jishu Xuebao/Journal of Vacuum Science and Technology, 2012, 32 (01): : 79 - 82