Anodic oxides on Hg1-xCdxTe studied using angle and X-ray power-dependent X-ray photoelectron spectroscopy

被引：0
|
作者：
Shimanoe, Kengo [1 ]
Sakashita, Masao [1 ]
机构：
[1] Nippon Steel Corp, Kawasaki, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 07期
关键词：
712.1.2 Compound Semiconducting Materials - 741.3 Optical Devices and Systems - 801.1 Chemistry; General;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
23
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页码：2066 / 2070
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