New method for measuring solution concentration by using the Moire technology

被引：0
|
作者：
South China Univ of Technology, Guangzhou, China [1 ]
机构：
来源：
Hongwai Yu Haomibo Xuebao | / 3卷 / 237-240期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
3
引用
收藏
相关论文
共 50 条
  • [21] Moire measuring technology for three-dimensional profile of the object
    Fu, YJ
    Yang, KT
    2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PTS 1 AND 2, 2006, 6150
  • [22] MEASURING OF DEFORMATION AT SPATIAL COMPLICATED ELEMENTS BY METHOD OF MOIRE
    ULLMANN, K
    MASCHINENBAU TECHNIK, 1972, 21 (11): : 502 - &
  • [23] Solution of the moire hole drilling method using a finite-element-method-based approach
    Cardenas-Garcia, Jaime F.
    Preidikman, Sergio
    INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 2006, 43 (22-23) : 6751 - 6766
  • [24] APPLICATION OF THE MOIRE METHOD FOR MEASURING LOCAL DEFORMATION ZONES
    DERGANOV, BS
    SITNIKOV, LL
    DUBININ, EK
    INDUSTRIAL LABORATORY, 1978, 44 (08): : 1157 - 1159
  • [25] A new method for measuring free drug concentration in retinal tissue
    Koskelainen, AO
    Nymark, S
    Haldin, C
    Tenhu, H
    INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE, 2002, 43 : U1113 - U1113
  • [26] A NEW METHOD FOR MEASURING N2O CONCENTRATION
    MOCHIZUKI, M
    OTA, Y
    KAMIMURA, Y
    MIYAMOTO, Y
    JAPANESE JOURNAL OF PHYSIOLOGY, 1964, 14 (06): : 599 - +
  • [27] A new moire interferometer for measuring in-plane displacement
    Lin, ST
    EXPERIMENTAL MECHANICS, 2001, 41 (02) : 140 - 143
  • [28] Non-contact method for measuring solution concentration using surface plasmon resonance apparatus and heterodyne interferometry
    Chen, Kun-Huang
    Chen, Jing-Heng
    Kuo, Shou-Wei
    Kuo, Tsung-Ter
    Lai, Ming-Hung
    OPTICS COMMUNICATIONS, 2010, 283 (10) : 2182 - 2185
  • [29] A Free Damping Oscillation Method for Measuring Electrolytic Solution Concentration by Two Electrodes
    Meng Fan
    Dong Yonggui
    PROCEEDINGS OF 2013 2ND INTERNATIONAL CONFERENCE ON MEASUREMENT, INFORMATION AND CONTROL (ICMIC 2013), VOLS 1 & 2, 2013, : 66 - 70
  • [30] The equipment for measuring of concentration profiles using the spreading resistance method
    Hybler, J
    Svagi, V
    CAS '96 PROCEEDINGS - 1996 INTERNATIONAL SEMICONDUCTOR CONFERENCE, 19TH EDITION, VOLS 1 AND 2, 1996, : 339 - 342
12345