Trocknung im Durchlauf mit Sorptionstechnik

被引：0
|
作者：
Kronauer, D. [1 ]
Nufer, S. [1 ]
Marinopoulos, A.G. [1 ]
Gemming, T. [1 ]
Elsasser, C. [1 ]
Kurtz, W. [1 ]
Kostlmeier, S. [1 ]
Ruhle, M. [1 ]
机构：
[1] Max-Planck-Inst. fur Metallforschung, Seestraße 92, D-70174 Stuttgart, Germany
来源：
JOT, Journal fuer Oberflaechentechnik | 2001年 / 41卷 / 05期
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摘要：
The feasibility to predict and to measure the electronics of an interface structure at an atomic level was studied. By comparison of calculated projected densities of electronic states and measured ELNES, a consistent and unequivocal decision about the microscopic interfacial structure was achieved and verified by quantitative HRTEM.
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页码：40 / 42
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