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Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity
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Department of Physics, Center for Laser Technology, Anna University, Madras 600 025, India
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Department of Physics, Center for Laser Technology, Anna University, Madras 600 025, India
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Appl. Opt.
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/ 16卷
/ 3447-3449期
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共 22 条
[21]
DE-CORRELATION EFFECTS IN SPECKLE-PATTERN INTERFEROMETRY .1. WAVELENGTH CHANGE DEPENDENT DE-CORRELATION WITH APPLICATION TO CONTOURING AND SURFACE-ROUGHNESS MEASUREMENT
WYKES, C
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LOUGHBOROUGH UNIV TECHNOL,DEPT MECH ENGN,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND
LOUGHBOROUGH UNIV TECHNOL,DEPT MECH ENGN,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND
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[22]
Mechanical stress measurement by an achromatic optical digital speckle pattern interferometry strain sensor with radial in-plane sensitivity: experimental comparison with electrical strain gauges
Viotti, Matias R.
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0
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Univ Fed Santa Catarina, Lab Metrol & Automatizacao, BR-88040970 Florianopolis, SC, Brazil
Univ Fed Santa Catarina, Lab Metrol & Automatizacao, BR-88040970 Florianopolis, SC, Brazil
Viotti, Matias R.
Armando Albertazzi, G., Jr.
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Univ Fed Santa Catarina, Lab Metrol & Automatizacao, BR-88040970 Florianopolis, SC, Brazil
Univ Fed Santa Catarina, Lab Metrol & Automatizacao, BR-88040970 Florianopolis, SC, Brazil
Armando Albertazzi, G., Jr.
Kapp, Walter A.
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Univ Fed Santa Catarina, Lab Metrol & Automatizacao, BR-88040970 Florianopolis, SC, Brazil
Univ Fed Santa Catarina, Lab Metrol & Automatizacao, BR-88040970 Florianopolis, SC, Brazil
Kapp, Walter A.
APPLIED OPTICS,
2011,
50
(07)
: 1014
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1022
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