Proton implant isolation of AlGaInP/GaAs Heterojunction bipolar transistor structures in fabrication

被引:0
|
作者
Cheng, Zhi-Qun [1 ]
Sun, Xiao-Wei [1 ]
Xia, Guan-Qun [1 ]
Li, Hong-Qin [1 ]
Sheng, Huai-Mao [1 ]
Qian, Rong [1 ]
机构
[1] Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, China
来源
Wuli Xuebao/Acta Physica Sinica | 2000年 / 49卷 / 02期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
In this paper, proton implant isolation and mask method are studied in Heterojunction bipolar transistor fabrication technology. By means of computation, the best implant dose is determined. After the wafer is annealed, the implant isolation efficiency is better. The best annealing temperature depends on ion implant dose. As temperature continues to rise, its resistivity starts to drop and tends to return to the state before annealing. Both Si3N4 and photoresist are used as double-layer mask, because the technology is simple and reproducibility is reliable, the wafer is not contaminated, implant efficiency and dc performance of the device are good.
引用
收藏
页码:377 / 378
相关论文
共 50 条
  • [1] Proton implant isolation of AlGaInP/GaAs heterojunction bipolar transistor structures in fabrication
    Cheng, ZQ
    Sun, XW
    Xia, GQ
    Li, HQ
    Sheng, HM
    Qian, R
    ACTA PHYSICA SINICA, 2000, 49 (02) : 375 - 378
  • [2] IMPLANT ISOLATION OF GAAS-ALGAAS HETEROJUNCTION BIPOLAR-TRANSISTOR STRUCTURES
    REN, F
    PEARTON, SJ
    HOBSON, WS
    FULLOWAN, IR
    LOTHIAN, J
    YANOF, AW
    APPLIED PHYSICS LETTERS, 1990, 56 (09) : 860 - 862
  • [3] Influence of deep levels on the performance of AlGaInP/GaAs heterojunction bipolar transistor
    Zhang, XH
    Hu, YS
    Wu, J
    Cheng, ZQ
    Xia, GQ
    Xu, YS
    Chen, ZH
    Gui, YS
    Chu, JH
    ACTA PHYSICA SINICA, 1999, 48 (03) : 556 - 560
  • [4] Heterojunction bipolar transistor with quaternary AlGaInP alloy emitter
    Cheng, Zhiqun
    Sun, Xiaowei
    Shu, Weimin
    Zhang, Xinghong
    Gu, Weidong
    Xia, Guanqun
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1999, 20 (05): : 425 - 428
  • [5] Contactless electroreflectance characterization of GaInP/GaAs heterojunction bipolar transistor structures
    Huang, YS
    Sun, WD
    Pollak, FH
    Freeouf, JL
    Calder, ID
    Mallard, RE
    APPLIED PHYSICS LETTERS, 1998, 73 (02) : 214 - 216
  • [6] Degradation of GaAs/AlGaAs heterojunction bipolar transistors with ion-implant isolation
    Frei, MR
    Chiu, TY
    Abernathy, CR
    Ren, F
    Fullowan, TR
    Lothian, J
    Pearton, SJ
    Tseng, B
    Montgomery, RK
    Smith, PR
    SOLID-STATE ELECTRONICS, 2002, 46 (09) : 1301 - 1305
  • [7] REDISTRIBUTION OF ZN IN GAAS-ALGAAS HETEROJUNCTION BIPOLAR-TRANSISTOR STRUCTURES
    HOBSON, WS
    PEARTON, SJ
    JORDAN, AS
    APPLIED PHYSICS LETTERS, 1990, 56 (13) : 1251 - 1253
  • [8] δ-doping InGaP/GaAs heterojunction bipolar transistor
    Chen, JY
    Cheng, SY
    Chang, WL
    Liu, WC
    MATERIALS CHEMISTRY AND PHYSICS, 1998, 53 (01) : 88 - 91
  • [9] δ-doping InGaP/GaAs heterojunction bipolar transistor
    Liu, WC
    Cheng, SY
    Chang, WL
    Pan, HJ
    Shie, YH
    PROCEEDINGS OF THE SYMPOSIUM ON LIGHT EMITTING DEVICES FOR OPTOELECTRONIC APPLICATIONS AND THE TWENTY-EIGHTH STATE-OF-THE-ART PROGRAM ON COMPOUND SEMICONDUCTORS, 1998, 98 (02): : 548 - 554
  • [10] Properties of the GaAs pseudo heterojunction bipolar transistor
    Yarn, KF
    Lew, KL
    Wang, YH
    Houng, MP
    INTERNATIONAL JOURNAL OF ELECTRONICS, 2006, 93 (01) : 19 - 27