Effects of film orientation on ferroelectric and piezoelectric properties of lanthanoid-substituted Bi4Ti3O12 thin films

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作者：
Adachi, Yutaka [1 ]
Muralt, Paul [2 ]
Setter, Nava [2 ]
机构：
[1] Opto-Electronic Group, Optronic Materials Center, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan
[2] Ceramics Laboratory, Swiss Federal Institute of Technology, EPFL, CH-11015 Lausanne, Switzerland
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1600年 / 46卷 / 02期
关键词：
The effects of film orientation on the ferroelectric and piezoelectric properties of (Bi3.25Ln0.75)Ti3O12 (Ln = La; Nd; and Sm) films were investigated. The films were grown on (111)Pt/TiO2/SiO2/Si and (100)IrO2/TiO 2/Si by pulsed laser deposition. The films grown on (111)Pt electrodes showed (001)/(117) mixed orientation. Nondoped films exhibited a highly preferred c-axis orientation. In contrast; a strong 117 peak was observed in the X-ray diffraction (XRD) patterns of (Bi3.25Sm 0.75)Ti3O12 films. The (117) orientation became dominant with decreasing radius of substituent ions. The films grown on (100)IrO2 electrodes showed predominantly (111) and (110) orientation. The piezoelectric coefficient d33f and remanent polarization Pr were larger in (111)- and (110)-oriented films than in (001)- and (117)-oriented films. © 2007 The Japan Society of Applied Physics;
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页码：686 / 690
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