Researched on properties of alumina substrate material prepared by low-temperature sintering

被引：0
|
作者：
Wang, Zhen [1 ]
Dang, Xin-An [1 ]
Zhang, Chang-Song [1 ]
机构：
[1] Institute of Electrical and Mechanical Engineering, Shaanxi University of Science and Technology, Xi'an 710021, China
来源：
Gongneng Cailiao/Journal of Functional Materials | 2009年 / 40卷 / 08期
关键词：
Temperature - Alumina - Dielectric losses - X ray diffraction - Bismuth compounds - Sintering - Aluminum oxide - Ceramic materials;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：1302 / 1304
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