IDO most superior pattern recognition model and its application in system risk assessment

被引：0

作者：

Li, De-Shun ^{[1
]}

Xu, Kai-Li ^{[2
]}

Cui, Yue-Feng ^{[1
]}

机构：

[1] School of Environmental and Chemical Engineering, Shenyang Ligong University, Shenyang 110168, China

[2] School of Resources and Civil Engineering, Northeastern University, Shenyang 110819, China

来源：

Dongbei Daxue Xuebao/Journal of Northeastern University | 2011年 / 32卷 / SUPPL.1期

关键词：

D O I：

暂无

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学科分类号：

摘要：

引用

页码：282 / 285

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