The frontier of technology development in remaining life assessment for high temperature components: II: Development of the remaining life assessment technology using SP creep test

被引：0
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作者：
Komazaki, Shin-Ichi [1 ]
机构：
[1] Graduate School of Sci. and Eng., Kagoshima Univ., Korimoto, Kagoshima, 890-0065, Japan
来源：
Zairyo/Journal of the Society of Materials Science, Japan | 2012年 / 61卷 / 12期
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D O I：
10.2472/jsms.61.980
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学科分类号：
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页码：980 / 986
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