The frontier of technology development in remaining life assessment for high temperature components: II: Development of the remaining life assessment technology using SP creep test

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作者
Komazaki, Shin-Ichi [1 ]
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[1] Graduate School of Sci. and Eng., Kagoshima Univ., Korimoto, Kagoshima, 890-0065, Japan
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10.2472/jsms.61.980
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页码:980 / 986
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