New index for reliability sensitivity analysis under epistemic uncertainty

被引：0
|
作者：
Suo, Bin [1 ]
Zeng, Chao [1 ]
Cheng, Yongsheng [1 ]
Li, Shiling [1 ]
机构：
[1] Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621900, China
来源：
Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica | 2013年 / 34卷 / 07期
关键词：
22;
D O I：
10.7527/S1000-6893.2013.0224
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1605 / 1615
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