Single-electron transfer by inter-dopant coupling tuning in doped nanowire silicon-on-insulator field-effect transistors

被引:0
|
作者
Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Naka-ku, Hamamatsu 432-8011, Japan [1 ]
机构
来源
关键词
Compendex;
D O I
071201
中图分类号
学科分类号
摘要
Doping (additives)
引用
收藏
相关论文
共 50 条
  • [42] In Situ Axially Doped n-Channel Silicon Nanowire Field-Effect Transistors
    Ho, Tsung-ta
    Wang, Yanfeng
    Eichfeld, Sarah
    Lew, Kok-Keong
    Liu, Bangzhi
    Mohney, Suzanne E.
    Redwing, Joan M.
    Mayer, Theresa S.
    NANO LETTERS, 2008, 8 (12) : 4359 - 4364
  • [43] Resonant tunneling behavior and discrete dopant effects in narrow ultrashort ballistic silicon-on-insulator metal-oxide-semiconductor field-effect transistors
    Gilbert, MJ
    Ferry, DK
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (04): : 2039 - 2044
  • [44] Experimental study on electron mobility in ultrathin-body silicon-on-insulator metal-oxide-semiconductor field-effect transistors
    Uchida, Ken
    Koga, Junji
    Takagib, Shin-ichi
    JOURNAL OF APPLIED PHYSICS, 2007, 102 (07)
  • [45] Experimental Study on Electron Mobility in Accumulation-Mode Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
    Kadotani, Naotoshi
    Ohashi, Teruyuki
    Takahashi, Tsunaki
    Oda, Shunri
    Uchida, Ken
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (09)
  • [46] Experimental study on electron mobility in ultrathin-body silicon-on-insulator metal-oxide-semiconductor field-effect transistors
    Uchida, Ken
    Koga, Junji
    Takagi, Shin-Ichi
    Journal of Applied Physics, 2007, 102 (07):
  • [47] A comprehensive study of magnetoresistance mobility in short channel transistors: Application to strained and unstrained silicon-on-insulator field-effect transistors
    Casse, M.
    Rochette, F.
    Thevenod, L.
    Bhouri, N.
    Andrieu, F.
    Reimbold, G.
    Boulanger, F.
    Mouis, M.
    Ghibaudo, G.
    Maude, D. K.
    JOURNAL OF APPLIED PHYSICS, 2009, 105 (08)
  • [48] Monte Carlo study of the electrothermal phenomenon in silicon-on-insulator and silicon-germanium-on-insulator metal-oxide field-effect transistors
    Sadi, Toufik
    Kelsall, Robert W.
    JOURNAL OF APPLIED PHYSICS, 2010, 107 (06)
  • [49] Unique method to electrically characterize a single stacking fault in silicon-on-insulator metal-oxide-semiconductor field-effect transistors
    Yang, J
    Neudeck, GW
    Denton, JP
    APPLIED PHYSICS LETTERS, 2000, 77 (24) : 4034 - 4036
  • [50] Study on Various Device Structures for Steep-Switching Silicon-on-Insulator Feedback Field-Effect Transistors
    Lee, Changhoon
    Shin, Changhwan
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (04) : 1852 - 1858