Schottky contact barrier height extraction by admittance measurement

被引：0
|
作者：
Jiang, Yu-Long [1 ]
Luo, Jia [1 ]
Yao, Ye [1 ]
Lu, Fang [2 ]
Ru, Guo-Ping [1 ]
Qu, Xin-Ping [1 ]
Li, Bing-Zong [1 ]
机构：
[1] Department of Microelectronics, Fudan University, Shanghai, 200433, China
[2] Department of Physics, Fudan University, Shanghai, 200433, China
来源：
Journal of Applied Physics | 2007年 / 101卷 / 05期
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