Reliability evaluation of LCD based on two-phase Wiener degradation process

被引：4
|
作者：
机构：
[1] [1,Yan, Wei-An
[2] 1,Song, Bao-Wei
[3] Duan, Gui-Lin
[4] Shi, Yi-Min
来源：
Yan, Wei-An | 1882年 / Chinese Institute of Electronics卷 / 36期
关键词：
17;
D O I：
10.3969/j.issn.1001-506X.2014.09.34
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学科分类号：
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