Robust parameter design methodology for microwave circuits considering the manufacturing variations

被引：1
|
作者：
Nakagawa, Takafumi [1 ]
Kirikoshi, Tasuku [2 ]
机构：
[1] Advanced Technology R and D Center, Mitsubishi Electric Corporation, 8-1-1, Tsukaguchi-Honmachi, Amagasaki, Hyogo, Japan
[2] Communication Systems Center, Mitsubishi Electric Corporation, 8-1-1, Tsukaguchi-Honmachi, Amagasaki, Hyogo, Japan
来源：
IAENG International Journal of Computer Science | 2012年 / 39卷 / 02期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
30
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收藏
页码：214 / 219
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