Structure, composition and dielectric characterization of tantalum peroxide film

被引：0
|
作者：
Zhang, Xing-Fu [1 ]
Wei, Ai-Xiang [1 ]
Hou, Tong-Xian [1 ]
机构：
[1] Faculty of Material and Energy, Guangdong University of Technology, Guangzhou 510006, China
来源：
Rengong Jingti Xuebao/Journal of Synthetic Crystals | 2008年 / 37卷 / 03期
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摘要：
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页码：684 / 688
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