High-speed defect detection of printed circuit board based on eddy-current testing method

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机构：
[1] Murata, Hiroaki
[2] Ikehata, Yoshio
[3] Yamada, Sotoshi
来源：
Murata, H. (hiro@blitz.ec.t.kanazawa-u.ac.jp) | 1600年 / Institute of Electrical Engineers of Japan卷 / 134期
关键词：
7;
D O I：
10.1541/ieejeiss.134.651
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