Exotic X-ray back-diffraction: A path toward a soft inelastic X-ray scattering spectrometer

被引：0

作者：

机构：

[1] Hönnicke, Marcelo Goncalves

[2] 2,Conley, Raymond

[3] Cusatis, Cesar

[4] Kakuno, Edson Massayuki

[5] Zhou, Juan

[6] Bouet, Nathalie

[7] Marques, Joao Basso

[8] Vicentin, Flavio Cesar

来源：

Hönnicke, Marcelo Goncalves | 1658年 / International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom卷 / 47期

关键词：

X ray diffraction;

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摘要：

Journal article (JA)

引用

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