Exotic X-ray back-diffraction: A path toward a soft inelastic X-ray scattering spectrometer

被引：0
|
作者：
机构：
[1] Hönnicke, Marcelo Goncalves
[2] 2,Conley, Raymond
[3] Cusatis, Cesar
[4] Kakuno, Edson Massayuki
[5] Zhou, Juan
[6] Bouet, Nathalie
[7] Marques, Joao Basso
[8] Vicentin, Flavio Cesar
来源：
Hönnicke, Marcelo Goncalves | 1658年 / International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom卷 / 47期
关键词：
X ray diffraction;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [1] Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer
    Hoennicke, Marcelo Goncalves
    Conley, Raymond
    Cusatis, Cesar
    Kakuno, Edson Massayuki
    Zhou, Juan
    Bouet, Nathalie
    Marques, Joao Basso
    Vicentin, Flavio Cesar
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2014, 47 : 1658 - 1665
  • [2] An inelastic x-ray scattering spectrometer at LNLS
    Tirao, G
    Stutz, G
    Cusatis, C
    JOURNAL OF SYNCHROTRON RADIATION, 2004, 11 : 335 - 342
  • [3] A new compact soft x-ray spectrometer for resonant inelastic x-ray scattering studies at PETRA III
    Yin, Z.
    Peters, H. B.
    Hahn, U.
    Agaker, M.
    Hage, A.
    Reininger, R.
    Siewert, F.
    Nordgren, J.
    Viefhaus, J.
    Techert, S.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2015, 86 (09):
  • [4] X-ray back-diffraction profiles with an Si(111) plate
    Cusatis, C
    Udron, D
    Mazzaro, I
    Giles, C
    Tolentino, H
    ACTA CRYSTALLOGRAPHICA SECTION A, 1996, 52 : 614 - 620
  • [5] Resonant inelastic soft X-ray scattering
    Eberhardt, W
    Luning, J
    Rubensson, JE
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1997, 65 (02): : 89 - 89
  • [6] A Dispersive Inelastic X-ray Scattering Spectrometer for Use at X-ray Free Electron Lasers
    Szlachetko, Jakub
    Nachtegaal, Maarten
    Grolimund, Daniel
    Knopp, Gregor
    Peredkov, Sergey
    Czapla-Masztafiak, Joanna
    Milne, Christopher J.
    APPLIED SCIENCES-BASEL, 2017, 7 (09):
  • [7] X-RAY SPECTROMETER FOR STUDY OF INELASTIC SCATTERING.
    Lyubimov, A.G.
    Bushuev, V.A.
    Lobanov, N.N.
    Instruments and experimental techniques New York, 1985, 28 (5 pt 2): : 1177 - 1180
  • [8] X-RAY SPECTROMETER FOR STUDY OF INELASTIC-SCATTERING
    LYUBIMOV, AG
    BUSHUEV, VA
    LOBANOV, NN
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1985, 28 (05) : 1177 - 1180
  • [9] Time resolved X-ray diffraction and non-thermal inelastic X-ray scattering
    Sondhauss, P
    Harbst, M
    Larsson, J
    Naylor, GA
    Plech, A
    Scheidt, K
    Synnergren, O
    Wark, JS
    Wulff, M
    SYNCHROTRON RADIATION INSTRUMENTATION, 2004, 705 : 1387 - 1390
  • [10] Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements
    Yin, Zhong
    Rehanek, Jens
    Loechel, Heike
    Braig, Christoph
    Buck, Jens
    Firsov, Alexander
    Viefhaus, Jens
    Erko, Alexei
    Techert, Simone
    OPTICS EXPRESS, 2017, 25 (10): : 10984 - 10996
12345