LEDs lead the way in white-light applications

被引:0
|
作者
机构
来源
Laser Focus World | 2006年 / 3卷 / S6-S8期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Applications of dispersive white-light spectral interferometry in optics
    Hlubina, P
    LIGHTMETRY AND LIGHT AND OPTICS IN BIOMEDICINE 2004, 2006, 6158
  • [22] Generation and potential applications of white-light propelling beams
    Cannan, Drake
    Zhang, Peng
    Chen, Zhigang
    2012 IEEE PHOTONICS CONFERENCE (IPC), 2012, : 290 - 291
  • [23] Generation and potential applications of white-light propelling beams
    Cannan, Drake
    Zhang, Peng
    Chen, Zhigang
    2012 ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE (ACP), 2012,
  • [24] A circular white-light flare with impulsive and gradual white-light kernels
    Hao, Q.
    Yang, K.
    Cheng, X.
    Guo, Y.
    Fang, C.
    Ding, M. D.
    Chen, P. F.
    Li, Z.
    NATURE COMMUNICATIONS, 2017, 8
  • [25] A circular white-light flare with impulsive and gradual white-light kernels
    Q. Hao
    K. Yang
    X. Cheng
    Y. Guo
    C. Fang
    M. D. Ding
    P. F. Chen
    Z. Li
    Nature Communications, 8
  • [26] Degradation modeling of mid-power white-light LEDs by using Wiener process
    Huang, Jianlin
    Golubovic, Dusan S.
    Koh, Sau
    Yang, Daoguo
    Li, Xiupeng
    Fan, Xuejun
    Zhang, G. Q.
    OPTICS EXPRESS, 2015, 23 (15): : A966 - A978
  • [27] Rapid Degradation of Mid-Power White-Light LEDs in Saturated Moisture Conditions
    Huang, Jianlin
    Golubovic, Dusan S.
    Koh, Sau
    Yang, Daoguo
    Li, Xiupeng
    Fan, Xuejun
    Zhang, G. Q.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015, 15 (04) : 478 - 485
  • [28] Degradation Mechanism Decoupling of Mid-Power White-Light LEDs by SPD Simulation
    Huang, Jianlin
    Golubovic, Dusan S.
    Koh, Sau
    Yang, Daoguo
    Li, Xiupeng
    Fan, Xuejun
    Zhang, Guoqi
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (07) : 2807 - 2814
  • [29] Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
    Huang, Jianlin
    Golubovic, Dusan S.
    Koh, Sau
    Yang, Daoguo
    Li, Xiupeng
    Fan, Xuejun
    Zhang, G. Q.
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2016, 154 : 152 - 159
  • [30] Three-wavelength quantum-well structures enable white-light LEDs
    不详
    LASER FOCUS WORLD, 2008, 44 (04): : 15 - 15