In situ strain profiling of elastoplastic bending in Ti-6Al-4V alloy by synchrotron energy dispersive x-ray diffraction

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作者：
Croft, M. [1 ,2 ]
Shukla, V. [3 ]
Akdogan, E.K. [3 ]
Jisrawi, N. [3 ,4 ]
Zhong, Z. [2 ]
Sadangi, R. [3 ]
Ignatov, A. [3 ]
Balarinni, L. [3 ]
Horvath, K. [1 ]
Tsakalakos, T. [3 ]
机构：
[1] Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854, United States
[2] National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, United States
[3] Department of Materials Science and Engineering, Rutgers University, Piscataway, NJ 08854, United States
[4] Department of Applied Physics, University of Sharjah, P.O. Box 27272, Sharjah, United Arab Emirates
来源：
Journal of Applied Physics | 2009年 / 105卷 / 09期
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