Consideration of secondary electron emission effect for probe measurement

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Faculty of Engineering, Yokohama National University, Yokohama 240-8501, Japan [1 ]
不详 [2 ]
不详 [3 ]
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来源：
Jpn. J. Appl. Phys. | / 9卷
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Compilation and indexing terms; Copyright 2025 Elsevier Inc;
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摘要：
Secondary emission - Probes
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