Practical 3-D measurement system based on projection pattern control techniques

被引：2
|
作者：
Cho, Genki [1 ,2 ]
Lu, Cunwei [1 ,2 ]
机构：
[1] Faculty of Engineering, Fukuoka Institute of Technology, Fukuoka, 811-0295, Japan
[2] Fukuoka Institute of Technology, Japan
来源：
IEEJ Transactions on Electronics, Information and Systems | 2007年 / 127卷 / 04期
关键词：
D O I：
10.1541/ieejeiss.127.561
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：561 / 567
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