A machine learning supported sinogram interpolation method for X-ray computed tomography

被引：0
|
作者：
Bellens, Simon [1 ,3 ]
Janssens, Michel [1 ]
Vandewalle, Patrick [2 ]
Dewulf, Wim [3 ]
机构：
[1] Materialise NV, Technologielaan 15, Leuven, Belgium
[2] EAVISE, PSI, Dept. of Electrical Engineering (ESAT), KU Leuven, Jan Pieter de Nayerlaan 5, Sint-Katelijne-Waver, Belgium
[3] Dept. of Mechanical Engineering, KU Leuven, Celestijnenlaan 300, Leuven, Belgium
来源：
e-Journal of Nondestructive Testing | 2023年 / 28卷 / 03期
关键词：
Compendex;
D O I：
10.58286/27720
中图分类号：
学科分类号：
摘要：
Interpolation
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