Resonance method for thickness determinant of vacuum evaporated thin films

被引：0

作者：

Kuzmin, A.V. ^{[1
]}

Semenenko, V.E. ^{[1
]}

Posukhov, Alexandr S. ^{[1
]}

Stervoyedov, N.G. ^{[1
]}

机构：

[1] V. Karazin National University of Kharkiv, 4, Svoboda Sq., Kharkiv, 61077, Ukraine

来源：

Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika) | 2009年 / 68卷 / 15期

关键词：

10;

D O I：

10.1615/TelecomRadEng.v68.i15.70

中图分类号：

学科分类号：

摘要：

引用

页码：1391 / 1398

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