Resonance method for thickness determinant of vacuum evaporated thin films

被引：0
|
作者：
Kuzmin, A.V. [1 ]
Semenenko, V.E. [1 ]
Posukhov, Alexandr S. [1 ]
Stervoyedov, N.G. [1 ]
机构：
[1] V. Karazin National University of Kharkiv, 4, Svoboda Sq., Kharkiv, 61077, Ukraine
来源：
Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika) | 2009年 / 68卷 / 15期
关键词：
10;
D O I：
10.1615/TelecomRadEng.v68.i15.70
中图分类号：
学科分类号：
摘要：
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页码：1391 / 1398
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