Fowler-Nordheim current oscillations in Si(111)/SiO2/twisted- Si(111) tunneling structures

被引：0

作者：

Moraru, Daniel ^{[1
]}

Kato, Hiroshi ^{[1
]}

Horiguchi, Seiji ^{[2
]}

Ishikawa, Yasuhiko ^{[1
]}

Ikeda, Hiroya ^{[1
]}

Tabe, Michiharu ^{[1
]}

机构：

[1] Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu, Shizuoka 432-8011, Japan

[2] Department of Electrical and Electronic Engineering, Akita University, 1-1 Tegata-Gakuen-machi, Akita 010-8502, Japan

来源：

Japanese Journal of Applied Physics, Part 2: Letters | 2006年 / 45卷 / 8-11期

关键词：

The dependence of Fowler-Nordheim current oscillations (FNCOs) on the twist angle between the facing Si layers in Si(111)/SiO2/Si(111) bonded structures is investigated. The observed systematic variation in oscillation amplitude with twist angle can be ascribed to transverse momentum conservation upon Fowler-Nordheim tunneling through thin SiO2. A calculation result; taking into account the twist-induced decrease in potential discontinuity and consequently in the reflection coefficient at the SiO 2/twisted Si interface; provides the theoretical basis for the experimental results. © 2006 The Japan Society of Applied Physics;

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摘要：

Journal article (JA)

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