Quantum simulation of noise in silicon nanowire transistors

被引：0
|
作者：
Park, Hong-Hyun [1 ]
Jin, Seonghoon [2 ]
Park, Young June [1 ]
Min, Hong Shick [1 ]
机构：
[1] School of Electrical Engineering and Computer Science, Seoul National University, Seoul, Korea, Republic of
[2] Silicon Engineering Group, Synopsys Inc., Mountain View, CA 94086, United States
来源：
Journal of Applied Physics | 2008年 / 104卷 / 02期
关键词：
Shot noise;
D O I：
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学科分类号：
摘要：
Journal article (JA)
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