Microwave measurement of dielectric film-enhanced Goos-Hanchen shift

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作者：
State Key Laboratory of Transient Optics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710068, China [1 ]
不详 [2 ]
不详 [3 ]
机构：
来源：
Zhongguo Jiguang | 2006年 / 6卷 / 753-755期
关键词：
Dielectric films;
D O I：
10.1007/s00775-006-0123-8
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