Fillet-lifting mechanism for Sn-Bi-Ag-Cu solder joint in lead-free wave soldering

被引:0
|
作者
He, Peng [1 ]
Zhao, Zhi-Li [2 ]
Qian, Yi-Yu [1 ]
Li, Zhong-Suo [3 ]
机构
[1] State Key Laboratory of Advanced Welding Production Technology, Harbin Institute of Technology, Harbin 150001, China
[2] School of Materials Science and Engineering, Harbin University of Science and Technology, Harbin 150080, China
[3] Sun East Electronic Development Co. Ltd., Shenzhen 518103, China
来源
Zhongguo Youse Jinshu Xuebao/Chinese Journal of Nonferrous Metals | 2006年 / 16卷 / 02期
关键词
Agglomeration - Bismuth - Copper - Crack initiation - Crack propagation - Cracks - Crystallization - Mathematical models - Plasticity - Segregation (metallography) - Shrinkage - Silver - Soldered joints - Strain - Stress concentration - Tin;
D O I
暂无
中图分类号
学科分类号
摘要
The mechanism of fillet-lifting for the Sn-Bi-Ag-Cu solder was studied, which is one of the mainly used lead-free solder in wave-soldering. The analysis results show that the segregation of Bi becomes more remarkable at the corner of the solder body/PCB pad. The local irregularity of Bi delays the solidification of the solder at the above area, and thus the residual liquid solder at that place becomes the aggregation area of shrinkage void during the following crystallization. The shrinkage strain exceeds the low plasticity of the Bi segregation solder in the later crystallization, then the crack is similar to that of the crystal crack. The presence of strong segregation element Bi exacerbates the probability of lift-off, which could be reduced by the rapidly cooling only in a limited extent. The stress-strain concentration is detected at the corner of Cu pad, the lower stress for the outer of Cu pad. Based on the above two leading reasons for fillet-lifting, the stress-strain concentration at the corner of Cu pad and the solidification delay, the mechanisms of fillet-lifting for Sn-Bi-Ag-Cu through-hole lead-free solder joint were given. Near the interface region of solder and Cu-pad, the liquidus of solder is lowered by the enriched Bi element, and the low plasticized zone produces at this region due to the existence of residual liquid phase. With the stress-strain concentration, the cracks produces near the corner of Cu pad and then propagated to its outer.
引用
收藏
页码:315 / 321
相关论文
共 50 条
  • [41] The Effect of Bi Addition on the Electromigration Properties of Sn-3.0Ag-0.5Cu Lead-Free Solder
    Zhang, Huihui
    Xu, Zhefeng
    Wang, Yan
    Tian, Caili
    Fan, Changzeng
    Motozuka, Satoshi
    Yu, Jinku
    METALS, 2024, 14 (10)
  • [42] Effect of the soldering time on the formation of interfacial structure between Sn-Ag-Zn lead-free solder and Cu substrate
    Wan, Jing Bo
    Liu, Yong Chang
    Wei, Chen
    Jiang, Peng
    Gao, Zhi Ming
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2008, 19 (12) : 1160 - 1168
  • [43] Reliability and Microstructural Studies of Sn-Ag-Cu Lead-Free Solder Joints in Pulse-Heated Reflow Soldering
    Mostofizadeh, M.
    Kokko, K.
    Frisk, L.
    2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 2163 - 2170
  • [44] Electrical and mechanical studies of the Sn-Ag-Cu-Bi and Sn-Ag-Cu-Bi-Sb lead free soldering materials
    Kisiel, R
    Gasior, W
    Moser, Z
    Pstrus, J
    Bukat, K
    Sitek, J
    ARCHIVES OF METALLURGY AND MATERIALS, 2005, 50 (04) : 1065 - 1071
  • [45] Mechanical properties of eutectic Sn-Bi lead-free solder with Ag addition
    Sakai, T
    Suganuma, K
    PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II, 2001, : 1111 - 1114
  • [46] Study on Electromigration Mechanism of Lead-Free Sn3.5Ag0.5Bi8.0In Solder Joints
    Jing Han
    Heng Cao
    Zhou Meng
    Xuelun Jin
    Limin Ma
    Fu Guo
    Tong An
    Ting Wang
    Journal of Electronic Materials, 2023, 52 : 1216 - 1232
  • [47] Study on Electromigration Mechanism of Lead-Free Sn3.5Ag0.5Bi8.0In Solder Joints
    Han, Jing
    Cao, Heng
    Meng, Zhou
    Jin, Xuelun
    Ma, Limin
    Guo, Fu
    An, Tong
    Wang, Ting
    JOURNAL OF ELECTRONIC MATERIALS, 2023, 52 (02) : 1216 - 1232
  • [48] Interfacial Reaction of Sn-Ag-Cu Lead-Free Solder Alloy on Cu: A Review
    Lee, Liu Mei
    Mohamad, Ahmad Azmin
    ADVANCES IN MATERIALS SCIENCE AND ENGINEERING, 2013, 2013
  • [49] The study of interficial reaction during rapidly solidified lead-free solder Sn3.5Ag0.7Cu/Cu laser soldering
    Liu, Jiahui
    Ma, Haitao
    Li, Shuang
    Sun, Junhao
    Kunwar, Anil
    Miao, Wang
    Hao, Jianjie
    Bao, Yanpeng
    2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2014, : 949 - 952
  • [50] Thermal and mechanical stability of soldering QFP with Sn-Bi-Ag lead-free alloy
    Suganuma, K
    Sakai, T
    Kim, KS
    Takagi, Y
    Sugimoto, J
    Ueshima, M
    IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2002, 25 (04): : 257 - 261