Ferroelectric and structural properties of Ba2-x Srx Na Nb5 O15 thin films prepared on La0.05 Sr0.95 Ti O3 substrates

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作者：
Higuchi, Tohru [1 ,2 ]
Yamasaki, Taro [2 ]
Suzuki, Yuko [2 ]
Gotoh, Keisuke [2 ]
Hattori, Takeshi [2 ]
Tsukamoto, Takeyo [2 ]
机构：
[1] Advanced Light Source, Lawrence Berkeley National Laboratory, MS 7R0222, 1 Cyclotron Road, Berkeley, CA 94720, United States
[2] Department of Applied Physics, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku, Tokyo 162-8601, Japan
来源：
Journal of Applied Physics | 2008年 / 103卷 / 08期
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