Test automation technology to reduce development costs and maintain software quality

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机构：
[1] Tanno, Haruto
[2] Zhang, Xiaojing
[3] Tabata, Keiichi
[4] Oinuma, Morihide
[5] Suguri, Kazuhito
来源：
| 1600年 / Nippon Telegraph and Telephone Corp.卷 / 12期
关键词：
Integration testing;
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