Damage phenomena of dielectric window material under X-band high power microwave

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作者
Hao, Xiwei [1 ]
Qiu, Shi [2 ]
Hou, Qing [3 ]
Huang, Wenhua [3 ]
Zhang, Guanjun [1 ]
机构
[1] State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710049, China
[2] School of Electronic Engineering, Xidian University, Xi'an 710071, China
[3] Northwest Institute of Nuclear Technology, Xi'an 710024, China
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页码:97 / 102
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