Test method of adjacent channel leakage ratio for TD-LTE terminal

被引：0
|
作者：
Wang, Nina [1 ]
Zhang, Zhi [1 ,2 ]
Jiang, Jun [1 ,2 ]
Tang, Tian [1 ,2 ]
Sun, Yanliang [1 ]
机构：
[1] School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China
[2] Beijing Starpoint Communications Software Co. Ltd., Beijing 100102, China
来源：
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument | 2011年 / 32卷 / 10期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Long Term Evolution (LTE)
引用
收藏
页码：2357 / 2362
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