Effect of strain on tunability in Ba0.60Sr 0.40TiO3 thin films on Pt-Si substrates

被引：0
|
作者：
Potrepka, D.M. [1 ]
Hirsch, S. [2 ]
Cole, M.W. [2 ]
Nothwang, W.D. [2 ]
Zhong, S. [3 ]
Alpay, S.P. [3 ]
机构：
[1] Sensors and Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, MD 20783
[2] Weapons and Materials Research Directorate, Active Materials Research Group, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD 21005
[3] Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT 06269
来源：
Journal of Applied Physics | 2006年 / 99卷 / 01期
关键词：
Thin films;
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学科分类号：
摘要：
Journal article (JA)
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页码：1 / 6
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