Efficient test case generation for detecting race conditions

被引：0
|
作者：
Setiadi, Theodorus E. [1 ]
Ohsuga, Akihiko [1 ]
Maekawa, Mamoru [1 ]
机构：
[1] Graduate School of Information Systems, University of Electro-Communications, Tokyo, Japan
来源：
IAENG International Journal of Computer Science | 2014年 / 41卷 / 02期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：112 / 130
相关论文
共 50 条
  • [21] Machine Intelligence for Efficient Test Pattern Generation
    Roy, Soham
    Millican, Spencer K.
    Agrawal, Vishwani D.
    2020 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2020,
  • [22] Efficient test generation using redundancy identification
    Han, SY
    Kang, SH
    IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2000, E83D (09) : 1814 - 1815
  • [23] Efficient delay test generation for modular circuits
    Ravikumar, CP
    Agrawal, N
    Agarwal, P
    SIXTH GREAT LAKES SYMPOSIUM ON VLSI, PROCEEDINGS, 1996, : 220 - 225
  • [24] MTTG: An Efficient Technique for Test Data Generation
    Rabbi, Khandakar
    Islam, Rafiqul
    Mamun, Quazi
    Kaosar, Mohammed Golam
    8TH INTERNATIONAL CONFERENCE ON SOFTWARE, KNOWLEDGE, INFORMATION MANAGEMENT AND APPLICATIONS (SKIMA 2014), 2014,
  • [25] Efficient test generation using redundancy identification
    Han, Sangyoon
    Kang, Sungho
    1814, IEICE of Japan, Tokyo, Japan (E83-D)
  • [26] Experiments on the Test Case Length in Specification Based Test Case Generation
    Fraser, Gordon
    Gargantini, Angelo
    2009 ICSE WORKSHOP ON AUTOMATION OF SOFTWARE TEST, 2009, : 18 - +
  • [27] OPTIMAL CONDITIONS FOR DETECTING BLOOD GROUP ANTIBODIES BY ANTIGLOBULIN TEST
    HUGHESJONES, NC
    GARDNER, B
    KLEINSCHMIDT, G
    TELFORD, R
    POLLEY, MJ
    VOX SANGUINIS, 1964, 9 (04) : 385 - &
  • [28] Investigations of the conditions for efficient high harmonic generation
    Baik, MG
    Nam, BI
    Kim, YS
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2000, 36 (05) : 275 - 278
  • [29] A consistency-based approach to efficient test case generation from timed automata specifications
    Kresic, D
    2004 IEEE CONFERENCE ON CYBERNETICS AND INTELLIGENT SYSTEMS, VOLS 1 AND 2, 2004, : 87 - 92
  • [30] Performance test case generation for microprocessors
    Bose, P
    16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 54 - 59
12345