Image edge detection of cephalogram based on multifractal multi-correlation variance

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作者
School of Electrical Engineering and Automatics, Harbin Institute of Technology, Harbin 150001, China [1 ]
不详 [2 ]
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来源
Harbin Gongye Daxue Xuebao | 2006年 / 6卷 / 902-905期
关键词
Feature extraction - Fractals - Image analysis - Probability;
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摘要
Multi-correlation variance approach based on multifractal used to estimate the multifractal spectrum is introduced. The probability based on X-ray image multi-correlation space is defined that can be used to estimate the multifractal spectrum. The multifractal spectrum property of cephalogram is analyzed and the relationship between the multifractal spectrum and its weight is discussed, so the multifractal linear region of cephalogram is determined. The geometrical properties of its multifractal are verified. The result of the edge detection of cephalogram used the above approach shows that the noise can be repressed effectively, the local property of an image can be remained as much as possible and the fine property can be stressed.
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